Scanning Electron Microscopic Analysis on the Deformation Mechanisms in Nacre

Author

R. Z. Wang, Z. Suo, A. G. Evans, N. Yao, I.A. Aksay, G.W. Bailey, R.L. Price, E. Voelkl, I.H. Musselman

Year of Conference

2001

Type

Conference Proceedings

Conference Name

Proc. Microscopy and Microanalysis

Pages

1118-19