@inbook{120521,
  author = {L. Yan and C. Punckt and I.A. Aksay and W. Mertin and G. Bacher and J. Ihm and H. Cheong},
  title = {Potential Distribution in Functionalized Graphene Devices Probed by Kelvin Probe Force Microscopy},
  abstract = { Kelvin probe force microscopy was used to study the impact of contacts and topography on the local potential distribution on contacted, individual functionalized graphene sheets (FGS) deposited on a SiO2/Si substrate. Negligible contact resistance is found at the graphene/Ti interface and a graphene resistance of 2.3 k Omega is extracted for a single sheet with sub-mu m size. Pronounced steps in the topography, which we attribute to a variation of the spacing between graphene and substrate, result in a significant change of the local resistivity. },
  year = {2011},
  journal = {Physics of Semiconductors: 30th International Conference on the Physics of Semiconductors},
  volume = {1399},
  publisher = {American Institute of Physics},
  isbn = {978-0-7354-1002-2},
  url = {https://doi.org/10.1063/1.3666628},
  language = {eng},
}